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    International Conference on Deep Learning for Image-Based Defect Detection

    ICDLIBDD

    Sat, Jun 27, 2026
    Antigua Guatemala, Guatemala

    The aim of the Conference is to provide a platform to the researchers and practitioners from both academia as well as industry to meet the share cuttingedge development in the field.

    ConferenceEngineeringData Science

    International Conference on Deep Learning for Image-Based Defect Detection

    ICDLIBDD

    Sat, Jun 27, 2026
    Antigua Guatemala, Guatemala

    The aim of the Conference is to provide a platform to the researchers and practitioners from both academia as well as industry to meet the share cuttingedge development in the field.

    Call for Papers

    deep learning
    image-based defect detection
    computer vision
    predictive modeling
    supervised learning
    unsupervised learning
    anomaly detection
    feature extraction
    convolutional neural networks
    defect classification
    industrial inspection
    quality control
    visual analytics
    predictive maintenance
    automated defect detection
    manufacturing analytics
    data preprocessing
    model optimization
    industrial IoT
    pattern recognition

    Important Dates

    Start Date

    Saturday, June 27, 2026

    Registration Deadline

    Friday, June 12, 2026

    Submission Deadline

    Sunday, June 7, 2026

    Venue
    Antigua Guatemala, Antigua Guatemala, Guatemala

    Antigua Guatemala, Guatemala

    Deadline: Jun 7, 2026

    Official Website
    Organizer

    ISAR

    Geeta Priya
    team@isar.org.in
    91 9789129171
    Quick Info
    TypeConference
    CountryGuatemala
    MonthJune-2026

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